arxiv
PublishedMay 27, 2026 at 4:00 AM
Diffuse to Detect: Generative Diffusion Models for Unsupervised IC Anomaly Detection
Publisher summary· verbatim
arXiv:2605.26468v1 Announce Type: cross Abstract: Latent defect screening is challenged by extremely low failure rates, high-dimensional test data, and absence of labeled anomalies. We propose the first unsupervised anomaly detection framework incorporating a Diffusion Transformer. Raw test measurem
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Originally published on arxiv ↗