arxiv5d ago
arXiv:2605.15212v2 Announce Type: replace-cross Abstract: We propose a new numerical method to estimate the fault tolerance of failure modes in digital circuit structures with a generative network sampling technique. From a random input of generated bitwise configurations of ideally digitalised anal
arxivMay 6
arXiv:2603.18066v2 Announce Type: replace-cross Abstract: Backpropagation has enabled modern deep learning but is difficult to realize as an online, fully distributed hardware learning system due to global error propagation, phase separation, and heavy reliance on centralized memory. Predictive codi
arxivApr 29bullish
arXiv:2604.14989v2 Announce Type: replace Abstract: Recent advances in large language models (LLMs) have sparked growing interest in automatic RTL optimization for better performance, power, and area (PPA). However, existing methods are still far from realistic RTL optimization. Their evaluation set
arxivApr 27bullish
arXiv:2604.22293v1 Announce Type: cross Abstract: Lookup-table (LUT) based neural networks can deliver ultra-low latency and excellent hardware efficiency on FPGAs by mapping arithmetic operations directly onto the logic primitives. However, state-of-the-art LUT-aware training (LAT) approaches remai
arxivApr 24bullish
arXiv:2604.19856v1 Announce Type: cross Abstract: Large Language Models (LLMs) show promise for generating Register-Transfer Level (RTL) code from natural language specifications, but single-shot generation achieves only 60-65% functional correctness on standard benchmarks. Multi-agent approaches su
arxivApr 23bullish
arXiv:2511.17265v2 Announce Type: replace-cross Abstract: Nowadays, we are witnessing an Artificial Intelligence revolution that dominates the technology landscape in various application domains, such as healthcare, robotics, automotive, security, and defense. Massive-scale AI models, which mimic th
arxivApr 7bullish
arXiv:2604.04727v1 Announce Type: cross Abstract: Classical computing is beginning to encounter fundamental limits of energy efficiency. This presents a challenge that can no longer be solved by strategies such as increasing circuit density or refining standard semiconductor processes. The growing c