arxiv
PublishedJuly 30, 2026 at 4:00 AM
—neutral
Dynamic Multi-Criteria Bottleneck Severity Index (DMBSI) for Semiconductor Wafer Manufacturing: A Genetically Optimised Framework for Reentrant Production Systems
Publisher summary· verbatim
arXiv:2607.24819v1 Announce Type: cross Abstract: Wafer fabrication exhibits unique characteristics, including reentrant process flows, variable bottlenecks, and highly variable process conditions. In order to identify the most severe bottleneck at each moment in time for semiconductor wafer fabrica
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Originally published on arxiv ↗